Title :
MHD and EMH effects in POS gap opening
Author :
Grossmann, J.M. ; Swanekamp, S.B. ; Fruchtman, Amnon ; Commisso, R.J. ; Huba, J.D. ; Oliver, Bryan V. ; Ottinger, P.F. ; Weber, B.V.
Author_Institution :
Div. of Plasma Phys., Naval Res. Lab., Washington, DC, USA
Abstract :
Summary form only given. Conduction and opening processes of plasma opening switches (POS) are examined with the aid of numerical simulations. In a POS, a plasma initially bridges a small axial region of the transmission line of an inductive energy storage generator. A section of vacuum transmission line then connects the POS region to a load. The plasma initially carries the generator current, allowing no current to flow to the load. Modifications to the plasma or to the current distribution in the plasma eventually open the POS, allowing power to flow to the load. These modifications can occur by a variety of different mechanisms: by plasma deformation and displacement, by magnetic field transport, or by a combination of such effects. Deformation and displacement are carried out by J/spl times/B forces and by electrostatic forces (ion erosion) associated with electron vortices. Magnetic field penetration can occur by electron-magneto-hydrodynamic (EMH) effects or resistive diffusion. Both particle-in-cell (PIC) and MHD codes are used to demonstrate many of these effects. In these simulations, a wide range of plasma densities (n/sub e/=5/spl times/10/sup 12/-5/spl times/10/sup 15/ cm/sup -3/) are examined.
Keywords :
inductive energy storage; plasma density; plasma devices; plasma magnetohydrodynamics; plasma simulation; plasma switches; pulsed power switches; transmission lines; vacuum switches; EMH effects; MHD effects; conduction processes; current distribution; electron vortices; electron-magneto-hydrodynamic effects; electrostatic forces; inductive energy storage generator; ion erosion; magnetic field penetration; magnetic field transport; numerical simulations; opening processes; particle-in-cell codes; plasma density; plasma opening switches; resistive diffusion; transmission line; vacuum transmission line; Bridges; Current distribution; Electrostatics; Energy storage; Magnetohydrodynamics; Numerical simulation; Plasma simulation; Plasma transport processes; Power transmission lines; Switches;
Conference_Titel :
Plasma Science, 1995. IEEE Conference Record - Abstracts., 1995 IEEE International Conference on
Conference_Location :
Madison, WI, USA
Print_ISBN :
0-7803-2669-5
DOI :
10.1109/PLASMA.1995.531615