Title :
Precision measurement of the FQHE resistance at filling factor 1/3
Author :
Ahlers, F.J. ; Pesel, E. ; Pierz, K. ; Warnecke, P. ; Wegscheider, W.
Author_Institution :
Phys.-Tech. Bundesanstalt, Braunschweig
Abstract :
A precision measurement of the fractional quantized Hall resistance in a high mobility two-dimensional electron system was carried out as a test of the universality of the quantum Hall effect. Our results indicate that the Hall resistance at filling factor nu=1/3 does not deviate from the theoretical value 3ldrh/e2 within a relative uncertainty of plusmn3.3 parts in 108 (k=2).
Keywords :
electric resistance measurement; quantum Hall effect; two-dimensional electron gas; filling factor; fractional quantized Hall resistance measurement; high mobility two-dimensional electron system; relative uncertainty; Crystalline materials; Density measurement; Electrical resistance measurement; Electron mobility; Filling; Gallium arsenide; Hall effect; Measurement standards; Temperature; Uncertainty;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location :
Broomfield, CO
Print_ISBN :
978-1-4244-2399-6
Electronic_ISBN :
978-1-4244-2400-9
DOI :
10.1109/CPEM.2008.4574630
