• DocumentCode
    2275593
  • Title

    Precision measurement of the FQHE resistance at filling factor 1/3

  • Author

    Ahlers, F.J. ; Pesel, E. ; Pierz, K. ; Warnecke, P. ; Wegscheider, W.

  • Author_Institution
    Phys.-Tech. Bundesanstalt, Braunschweig
  • fYear
    2008
  • fDate
    8-13 June 2008
  • Firstpage
    16
  • Lastpage
    17
  • Abstract
    A precision measurement of the fractional quantized Hall resistance in a high mobility two-dimensional electron system was carried out as a test of the universality of the quantum Hall effect. Our results indicate that the Hall resistance at filling factor nu=1/3 does not deviate from the theoretical value 3ldrh/e2 within a relative uncertainty of plusmn3.3 parts in 108 (k=2).
  • Keywords
    electric resistance measurement; quantum Hall effect; two-dimensional electron gas; filling factor; fractional quantized Hall resistance measurement; high mobility two-dimensional electron system; relative uncertainty; Crystalline materials; Density measurement; Electrical resistance measurement; Electron mobility; Filling; Gallium arsenide; Hall effect; Measurement standards; Temperature; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
  • Conference_Location
    Broomfield, CO
  • Print_ISBN
    978-1-4244-2399-6
  • Electronic_ISBN
    978-1-4244-2400-9
  • Type

    conf

  • DOI
    10.1109/CPEM.2008.4574630
  • Filename
    4574630
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2275593