DocumentCode :
2275690
Title :
A 180-nm CMOS time-of-flight 3-D image sensor
Author :
Betta, Gian-Franco Dalla ; Donati, Silvano ; Martini, Giuseppe ; Pancheri, Lucio ; Stoppa, David ; Verzellesi, Giovanni
Author_Institution :
DISI, Univ. di Trento, Trento, Italy
fYear :
2010
fDate :
12-16 July 2010
Firstpage :
1
Lastpage :
3
Abstract :
We report on the design and the experimental characterization of a new 3-D image sensor, based on a new 120-nm CMOS-compatible photo-detector, which features an internal demodulation mechanism effective up to high frequencies. The distance range covered by our proof-of-concept device spans from 1-m to a few meter, and the resolution is about 1-cm.
Keywords :
CMOS image sensors; demodulators; optical design techniques; optical resolving power; photodetectors; CMOS time-of-flight 3D image sensor; CMOS-compatible photodetector; internal demodulation; optical design; wavelength 120 nm; wavelength 180 nm; Demodulation; Electrodes; Frequency modulation; Image sensors; Noise; Pixel;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Optics (WIO), 2010 9th Euro-American Workshop on
Conference_Location :
Helsinki
Print_ISBN :
978-1-4244-8226-9
Electronic_ISBN :
978-1-4244-8227-6
Type :
conf
DOI :
10.1109/WIO.2010.5582487
Filename :
5582487
Link To Document :
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