Title :
Measurement of complex permittivity of dielectric materials in millimeter wave region by whispering gallery mode method
Author :
Tamura, Hajime ; Kogami, Yoshinori ; Matsumura, Kazuhito
Author_Institution :
Fac. of Eng., Utsunomiya Univ., Japan
Abstract :
A new and simple evaluation method for complex permittivity of dielectric materials in millimeter wave region is presented. The method is based on the Whispering Gallery mode (WG mode) resonance in a dielectric disk which is made of the material under test. The WG mode resonator system is constructed only by the dielectric disk with coupled dielectric waveguides, without any metallic parts. As a result, this system has no metallic dissipation. We can obtain highly accurate results for the evaluation of low-loss dielectric materials in the millimeter wave region. In this paper, we present the measuring principle of the complex permittivity, optimum dimensions of the test piece (disk diameter and thickness), measurement procedure and some examples of the measuring results in 50 to 110 GHz band
Keywords :
dielectric resonators; millimetre wave measurement; permittivity measurement; 50 to 110 GHz; EHF; MM-wave measurement procedure; WG mode resonance; WG mode resonator system; complex permittivity; coupled dielectric waveguides; dielectric disk; dielectric materials; low-loss materials; millimeter wave region; whispering gallery mode resonance; Dielectric materials; Dielectric measurements; Materials testing; Millimeter wave measurements; Millimeter wave technology; Permittivity measurement; Resonance; Thickness measurement; Waveguide components; Whispering gallery modes;
Conference_Titel :
Microwave Conference, 2001. APMC 2001. 2001 Asia-Pacific
Conference_Location :
Taipei
Print_ISBN :
0-7803-7138-0
DOI :
10.1109/APMC.2001.985354
