Far field RCS prediction by near field RCS measurement

Author

Chang, Dau-Chyrh ; Tzay, Min-Cher ; Chung, Ru-Chi

Author_Institution

Dept. of Electron. Eng., Da Yeh Univ., Taiwan, China

Volume

3

fYear

2001

fDate

2001

Firstpage

1239

Abstract

The near field system can be used for measuring the performance of antennas and it can also be used for RCS (Radar Cross Section) measurement. The far field patterns for both antenna and RCS can be generated by the transformation of the measured near field data. In this paper the concept of transformation is applied for obtaining the far field RCS of a radar target from the near field measurement data. The processing technique is used to generate the far field RCS pattern. The results of far field RCS by this proposed technique agree quite well with that obtained by direct far field measurement

Keywords

S-parameters; microwave measurement; radar cross-sections; 3 to 15 GHz; S-parameters; far field RCS pattern generation; far field RCS prediction; measured near field data transformation; near field RCS measurement; radar cross section measurement; radar target; Antenna measurements; Area measurement; Light scattering; Optical scattering; Radar antennas; Radar cross section; Radar measurements; Radar scattering; Size measurement; Time measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Conference, 2001. APMC 2001. 2001 Asia-Pacific

Conference_Location

Taipei

Print_ISBN

0-7803-7138-0

Type

conf

DOI

10.1109/APMC.2001.985358

Filename

985358