• DocumentCode
    2276111
  • Title

    Nonlinear Dielectric Bahaviour of Metal/Ferroelectric/Metal and Metal/Ferroelectric/Semiconductor-Heterostructures

  • Author

    Barz, K. ; Diestelhorst, M. ; Beige, H. ; Geske, L. ; Alexe, M. ; Hesse, D.

  • Author_Institution
    Martin-Luther-Univ., Halle-Wittenberg
  • fYear
    2007
  • fDate
    27-31 May 2007
  • Firstpage
    212
  • Lastpage
    213
  • Abstract
    The influence of size effects and of the microstructure of interfaces and thin films on the linear properties of ferroelectrics is presently a widely studied topic world-wide. However, their influence on nonlinear properties of nanoscaled ferroelectrics is widely unknown. The paper is devoted to the well-defined preparation of nanoscaled ferroelectrics and to investigations into the influence of size and microstructure effects on their nonlinear properties. Different metal/ferroelectric/metal-(MFM) and metal/ferroelectric/semiconductor-(MFS) heterostructures were prepared. The ferroelectric materials used are PZT and bismuth titanate. The nonlinear dielectric properties where analyzed by inspecting the amplitude-frequency-characteristics of a nonlinear series resonance circuit, which contained the heterostructures as nonlinear capacitance.
  • Keywords
    bismuth compounds; capacitance; ferroelectric thin films; lead compounds; multilayers; nanostructured materials; BiTiO; PZT; amplitude-frequency-characteristics; bismuth titanate; interfaces; linear property; metal-ferroelectric-metal heterostructure; metal-ferroelectric-semiconductor heterostructure; microstructure; nanoscaled ferroelectrics; nonlinear capacitance; nonlinear dielectric property; resonance circuit; size effects; thin films; well-defined preparation; Automatic frequency control; Dielectric thin films; Ferroelectric materials; Impedance measurement; Magnetic force microscopy; Microstructure; Nonlinear equations; Physics; RLC circuits; Resonance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2007. ISAF 2007. Sixteenth IEEE International Symposium on
  • Conference_Location
    Nara
  • ISSN
    1099-4734
  • Print_ISBN
    978-1-4244-1334-8
  • Electronic_ISBN
    1099-4734
  • Type

    conf

  • DOI
    10.1109/ISAF.2007.4393217
  • Filename
    4393217