Title :
Precision differential sampling measurements of low frequency voltages synthesized with an AC Programmable Josephson Voltage Standard
Author :
Rufenacht, A. ; Burroughs, C.J. ; Benz, S.P. ; Dresselhaus, P.D. ; Waltrip, B. ; Nelson, T.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO
Abstract :
Sampling is a promising technique for comparing the stepwise-approximated sine waves synthesized by an AC Programmable Josephson Voltage Standard to the sinusoidal voltages of a secondary source at low frequencies (a few hundred hertz or less). This paper describes a differential method that uses an integrating sampling voltmeter to precisely determine the amplitude and phase of high purity sine wave voltages by comparing them to quantum-accurate waveforms.
Keywords :
Josephson effect; measurement standards; voltage measurement; voltmeters; AC programmable Josephson voltage standard; integrating sampling voltmeter; low frequency voltage synthesis; low-frequency AC voltage waveform measurement; precision differential sampling measurement; secondary source sinusoidal voltage; stepwise-approximated sine wave synthesis; Detectors; Frequency measurement; Frequency synthesizers; Low voltage; Measurement standards; NIST; Sampling methods; Signal generators; Stability; Voltmeters;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location :
Broomfield, CO
Print_ISBN :
978-1-4244-2399-6
Electronic_ISBN :
978-1-4244-2400-9
DOI :
10.1109/CPEM.2008.4574657
