Title :
Memorial Lecture for Dr. H. Okino
Author_Institution :
Nat. Defense Acad., Yokosuka
Abstract :
Dr. Okino´s contributions for piezoelectric application field will be introduced. First of all, by using piezoresponse force microscopy (PFM) and contact-resonance piezoresponse microscopy (CR-PFM), domain structures and domain-related properties of typical piezoelectric single crystal, for example PbTiO3, Pb(Mg1/3Nb2/3)O3 -PbTiO3 single crystals, were successfully observed. Four kinds of domain structures (180 c-c, 180 a-a, 90 a-a and 90 a-c domains) on grown surfaces of PbTiO3 single crystals were imaged successfully using vertical and lateral piezoresponse force microscopy (PFM). Next, the domain-structure images of (001) plates of Pb(Mg1/3Nb2/3)O3 -PbTiO3 (PMN-PT) single crystals were successfully observed in a vacuum using a contact-resonance piezoresponse force microscopy. The domain structures of (001) plates of (l-x) Pb(Mg1/3Nb2/3)O3-xPbTiO3 (PMN-PT) single crystals were obtained at room temperature after 240 thermal treatment at various cooling rates. PMN -32 % PT and PMN- 34 %PT single crystals undergoes a relaxor-ferroelectric phase transition from Tetragonal phase to the Cubic phase.
Keywords :
elastic constants; electric domains; ferroelectric transitions; heat treatment; lead compounds; permittivity; piezoelectric materials; piezoelectric thin films; relaxor ferroelectrics; CR-PFM; PFM; PbMg0.3Nb0.6O3-PbTiO3; PbTiO3; contact-resonance piezoresponse microscopy; dielectric constant; domain structures; elastic constants; finite element method; piezoelectric application; piezoelectric single crystal; piezoresponse force microscopy; relaxor-ferroelectric phase transition; room temperature; temperature 293 K to 298 K; thermal treatment; Atomic force microscopy; Cooling; Crystals; Electrodes; Fingerprint recognition; Piezoelectric films; Polarization; Surface topography; Surface treatment; Temperature;
Conference_Titel :
Applications of Ferroelectrics, 2007. ISAF 2007. Sixteenth IEEE International Symposium on
Conference_Location :
Nara
Print_ISBN :
978-1-4244-1334-8
Electronic_ISBN :
1099-4734
DOI :
10.1109/ISAF.2007.4393222