DocumentCode :
2276228
Title :
A passive lossless snubber cell with minimum stress and wide soft-switching range
Author :
Li, River T H ; Chung, Henry S H
Author_Institution :
City Univ. of Hong Kong, Kowloon, China
fYear :
2009
fDate :
20-24 Sept. 2009
Firstpage :
685
Lastpage :
692
Abstract :
A passive lossless snubber cell and its dual structure for reducing the switching loss of a range of switching converters are presented. The proposed snubber cell has several advantages over existing snubbering techniques. First, it provides zero-current-switching (ZCS) and zero-voltage-switching (ZVS) conditions for turning on and off, respectively, the switch over a wide load range. Second, it does not introduce extra voltage stress on the switch. Third, by taking the ripple current through the switch into account, the peak switch current during the snubber resonance period is designed to be less than the designed switch current without the snubber. Hence, the proposed snubber does not introduce extra current stress on the switch. The operating principle, procedure of designing the values of the components and soft-switching range of the snubber will be given. Connections of the snubber cells to different switching converters will be depicted. A performance comparison among the proposed snubber and two previously studied snubber cells will be addressed. The proposed snubber has been successfully applied to an example of a 200W, 380V/24V, 100kHz two-switch flyback converter operating in continuous conduction modes. Experimental results are in good agreement with the theoretical predictions.
Keywords :
snubbers; switching convertors; zero current switching; zero voltage switching; ZCS; ZVS; frequency 100 kHz; passive lossless snubber cell; power 200 W; switching converters; two-switch flyback converter; voltage 380 V to 24 V; zero-current-switching condition; zero-voltage-switching condition; Snubbers; passive lossless snubber; soft-switching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Energy Conversion Congress and Exposition, 2009. ECCE 2009. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-2893-9
Electronic_ISBN :
978-1-4244-2893-9
Type :
conf
DOI :
10.1109/ECCE.2009.5316180
Filename :
5316180
Link To Document :
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