Field programmable thermal emulator (FPTE): An all-silicon test structure for thermal characterization of integrated circuits

Author

Wen Yueh ; Ahmed, Khondker Zakir ; Mukhopadhyay, Saibal

Author_Institution

Sch. of ECE, Georgia Inst. of Technol., Atlanta, GA, USA

fYear

2014

fDate

9-13 March 2014

Firstpage

66

Lastpage

71

Abstract

This paper presents an on-chip digitally programmable test structure, referred to as the field programmable thermal emulator (FPTE), for on-line characterization of power pattern, time-varying thermal field, and associated changes in the electrical characteristics of the transistors. A test chip was designed in 130nm CMOS to validate the test structure. The measurement results demonstrated the ability of FPTE to emulate various power patterns and capture the effects on temperature and circuit performance.

Keywords

CMOS integrated circuits; MOSFET; elemental semiconductors; integrated circuit design; integrated circuit testing; programmable circuits; silicon; thermal engineering; CMOS technology; FPTE; Si; all-silicon test structure; electrical characteristics; field programmable thermal emulator; integrated circuit; on-chip digitally programmable test structure; power pattern characterization; size 130 nm; time-varying thermal field characterization; transistor; Heating; Registers; System-on-chip; Temperature; Temperature sensors;

fLanguage

English

Publisher

ieee

Conference_Titel

Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2014 30th Annual

Conference_Location

San Jose, CA

Type

conf

DOI

10.1109/SEMI-THERM.2014.6892217

Filename

6892217