Title :
Field programmable thermal emulator (FPTE): An all-silicon test structure for thermal characterization of integrated circuits
Author :
Wen Yueh ; Ahmed, Khondker Zakir ; Mukhopadhyay, Saibal
Author_Institution :
Sch. of ECE, Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
This paper presents an on-chip digitally programmable test structure, referred to as the field programmable thermal emulator (FPTE), for on-line characterization of power pattern, time-varying thermal field, and associated changes in the electrical characteristics of the transistors. A test chip was designed in 130nm CMOS to validate the test structure. The measurement results demonstrated the ability of FPTE to emulate various power patterns and capture the effects on temperature and circuit performance.
Keywords :
CMOS integrated circuits; MOSFET; elemental semiconductors; integrated circuit design; integrated circuit testing; programmable circuits; silicon; thermal engineering; CMOS technology; FPTE; Si; all-silicon test structure; electrical characteristics; field programmable thermal emulator; integrated circuit; on-chip digitally programmable test structure; power pattern characterization; size 130 nm; time-varying thermal field characterization; transistor; Heating; Registers; System-on-chip; Temperature; Temperature sensors;
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2014 30th Annual
Conference_Location :
San Jose, CA
DOI :
10.1109/SEMI-THERM.2014.6892217
