Title :
Calibrating a sampling voltmeter using a binary Josephson system
Author :
Van den Brom, Helko E. ; Houtzager, Ernest ; Martina, Quincy E V N ; Rietveld, Gert
Author_Institution :
NMi Van Swinden Lab., Delft
Abstract :
A binary Josephson system was used to characterize an 81/2-digit sampling voltmeter. This voltmeter is the heart of the primary standard for power at 50 Hz or 60 Hz at several National Metrology Institutes (NMIs). In this paper, we present first results on the calibration of the voltmeter under conditions that mimic its use in the power standard set-up. Furthermore, the dependence of the root-mean-square (rms) voltage FRMS on the aperture time is presented.
Keywords :
calibration; measurement standards; superconducting junction devices; voltage measurement; voltmeters; NMI; National Metrology Institutes; binary Josephson system; frequency 50 Hz; frequency 60 Hz; root-mean-square voltage; sampling voltmeter calibration; voltage measurement; voltage standard; Apertures; Calibration; Josephson junctions; Linearity; Oscilloscopes; Power measurement; Sampling methods; System testing; Voltage; Voltmeters;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location :
Broomfield, CO
Print_ISBN :
978-1-4244-2399-6
Electronic_ISBN :
978-1-4244-2400-9
DOI :
10.1109/CPEM.2008.4574672
