Title :
Fractal diffraction and focusing properties of binary phase gratings
Author :
Brenner, K.-H. ; Buschlinger, R.
Author_Institution :
Optoelectron., Univ. of Heidelberg, Mannheim, Germany
Abstract :
We observed, that a simple binary phase grating under certain circumstances exhibits pronounced focusing properties. In the paraxial approximation, the on-axis intensity as a function of the grating duty cycle shows a perfect fractal behavior. We discuss the properties of lens scaling and phase binarization in the paraxial, the non-paraxial and the rigorous case. Furthermore, we investigate the optimal focusing conditions for binary phase gratings. Also, possible applications in light concentration, image scanning and wave-front sensing are discussed.
Keywords :
diffraction gratings; image sensors; light diffraction; microlenses; optical focusing; optical scanners; wavefront sensors; Fractal diffraction; binary phase gratings; focusing properties; image scanning; lens scaling; light concentration; microlenses; paraxial approximation; phase binarization; wave-front sensing; Detectors; Diffraction; Focusing; Gratings; Lenses; Pixel;
Conference_Titel :
Information Optics (WIO), 2010 9th Euro-American Workshop on
Conference_Location :
Helsinki
Print_ISBN :
978-1-4244-8226-9
Electronic_ISBN :
978-1-4244-8227-6
DOI :
10.1109/WIO.2010.5582520
