Title :
Talbot-Lau moire x-ray diagnostic for high energy density plasmas
Author :
Valdivia, M.P. ; Stutman, D. ; Finkenthal, M.
Author_Institution :
Dept. of Phys. & Astron., Johns Hopkins Univ., Baltimore, MD, USA
Abstract :
Summary form only given. Phase-contrast x-ray diagnostics can detect density gradients in low-Z matter with the sensitivity and spatial resolution necessary to characterize High Energy Density Plasma (HEDP) experiments. Talbot-Lau interferometry measures x-ray beam angular deviations due to refraction index gradients along its path and can simultaneously provide x-ray attenuation, refraction, and scatter images of an object. We have extended the Talbot-Lau method from the low magnification and high energy (30-100 keV) setup used in medical applications, to the high magnification and low energy (8-20 keV) setup HEDLP experiments require. We also developed single image based phase-retrieval techniques such as Talbot-Lau Moiré deflectometry. The results obtained using low-Z test objects suggest a clear advantage of Talbot-Lau Moiré deflectometry over conventional radiography for density diagnostic in HEDP. The Moiré technique can detect with good spatial resolution both sharp and smooth density gradients, and can use incoherent, extended x-ray sources emitting either lines or continuum, thus allowing for a wide range of backlighters.
Keywords :
Talbot effect; plasma X-ray sources; plasma diagnostics; refractive index; Talbot-Lau interferometry; Talbot-Lau moire X-ray diagnostic; Talbot-Lau moire deflectometry; X-ray attenuation; X-ray beam angular deviation measurement; density diagnostics; electron volt energy 30 keV to 100 keV; electron volt energy 8 keV to 20 keV; extended X-ray sources; high energy density plasma experiments; high energy density plasmas; incoherent X-ray sources; low-Z test objects; phase-contrast X-ray diagnostics; radiography; refraction index gradients; single image based phase-retrieval techniques; spatial resolution; Astronomy; Educational institutions; Physics; Plasmas; Sensitivity; Spatial resolution; X-ray imaging;
Conference_Titel :
Plasma Sciences (ICOPS) held with 2014 IEEE International Conference on High-Power Particle Beams (BEAMS), 2014 IEEE 41st International Conference on
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4799-2711-1
DOI :
10.1109/PLASMA.2014.7012465