Title :
The properties of commercial thick film resistance elements as ac-dc transfer standards
Author :
Fletcher, N. ; Goebel, R.
Author_Institution :
Bur. Int. des Poids et Mesures, Sevres
Abstract :
A new set of ac-dc resistance transfer standards are being developed for use in the BIPM quadrature bridge. These resistors use commercial thick film resistance elements, whose small ac-dc difference is calibrated against a calculable coaxial reference. The improved stability of the new resistors should reduce the overall uncertainty of the quadrature transfer.
Keywords :
electric variables measurement; thick film resistors; transfer standards; BIPM quadrature bridge; Bureau International des Poids et Mesures; ac-dc resistance transfer standards; commercial thick film resistance elements; quadrature transfer; resistors; Bridges; Coaxial components; Electrical resistance measurement; Frequency dependence; Frequency measurement; Impedance measurement; Resistors; Stability; Temperature; Thick films;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location :
Broomfield, CO
Print_ISBN :
978-1-4244-2399-6
Electronic_ISBN :
978-1-4244-2400-9
DOI :
10.1109/CPEM.2008.4574677
