DocumentCode
2276521
Title
The properties of commercial thick film resistance elements as ac-dc transfer standards
Author
Fletcher, N. ; Goebel, R.
Author_Institution
Bur. Int. des Poids et Mesures, Sevres
fYear
2008
fDate
8-13 June 2008
Firstpage
110
Lastpage
111
Abstract
A new set of ac-dc resistance transfer standards are being developed for use in the BIPM quadrature bridge. These resistors use commercial thick film resistance elements, whose small ac-dc difference is calibrated against a calculable coaxial reference. The improved stability of the new resistors should reduce the overall uncertainty of the quadrature transfer.
Keywords
electric variables measurement; thick film resistors; transfer standards; BIPM quadrature bridge; Bureau International des Poids et Mesures; ac-dc resistance transfer standards; commercial thick film resistance elements; quadrature transfer; resistors; Bridges; Coaxial components; Electrical resistance measurement; Frequency dependence; Frequency measurement; Impedance measurement; Resistors; Stability; Temperature; Thick films;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location
Broomfield, CO
Print_ISBN
978-1-4244-2399-6
Electronic_ISBN
978-1-4244-2400-9
Type
conf
DOI
10.1109/CPEM.2008.4574677
Filename
4574677
Link To Document