Title :
Synthesis and Characterization of PZT Ferroelectric Nanocrystals Current Measurement
Author :
Kubo, K. ; Echizen, M. ; Nishida, T. ; Takeda, T. ; Uchiyama, K. ; Shiosaki, T.
Author_Institution :
Nara Inst. of Sci. & Technol. (NAIST), Nara
Abstract :
Ferroelectric lead zirconium titanate (PZT) has been used in FeRAMs, which are expected to become common large capacity devices. We have extensively studied PZT thin films and their micro-processing. However, there are several problems of degradation by crystal defects at grain boundaries in thin films and surface damage by microfabrication. Self-assembled nanocrystals are useful for solving these problems. However, position control in nanocrystal growth is very difficult. Thus, atomically flat substrates and RF magnetron sputtering together are used for better position control. RF magnetron sputtering stimulates nucleation of crystals because the sputtered particles impinge on substrates with high energy. We grew PZT nanocrystals on alpha-Al2O3 (001) single crystalline substrate surfaces. Atomic force microscopy observations indicated that triangular-shaped crystals were formed on the substrates.
Keywords :
aluminium compounds; atomic force microscopy; ferroelectric thin films; grain boundaries; lead compounds; nanostructured materials; nanotechnology; nucleation; self-assembly; sputter deposition; Al2O3; FeRAMs; PZT ferroelectric nanocrystals; PZT thin films; PbZrO3TiO3; RF magnetron sputtering; alpha-Al2O3 (001); atomic force microscopy; capacity devices; crystal defects; crystal nucleation; grain boundaries; micro-processing; microfabrication; nanocrystal growth; self-assembled nanocrystals; surface damage; Atomic force microscopy; Crystallization; Current measurement; Ferroelectric materials; Grain boundaries; Nanocrystals; Position control; Radio frequency; Sputtering; Zirconium;
Conference_Titel :
Applications of Ferroelectrics, 2007. ISAF 2007. Sixteenth IEEE International Symposium on
Conference_Location :
Nara
Print_ISBN :
978-1-4244-1334-8
Electronic_ISBN :
1099-4734
DOI :
10.1109/ISAF.2007.4393244