• DocumentCode
    2276783
  • Title

    Phase analysis of discharge magnitude distributions inside a small void and its applications to diagnosis of deteriorating insulations

  • Author

    Ito, T. ; Jogan, K. ; Saito, T. ; Ehara, Y.

  • Author_Institution
    Musashi Inst. of Technol., Tokyo, Japan
  • fYear
    1989
  • fDate
    29 Oct-2 Nov 1989
  • Firstpage
    111
  • Lastpage
    116
  • Abstract
    A breakdown phenomenon of electrical equipment due to the deterioration of insulation was investigated. The degree of deterioration or breakdown of the insulating system was predicted from the distribution of induced electric charges inside small voids in an insulator-the discharge magnitude distribution. This distribution was measured by a special internal-discharge pulse measurement system, which analyzes it according to the phase area of the applied AC 50-Hz voltage. This technique was used to investigate tree progression in the microvoid of PMMA (polymethyl methacrylate). The density and the growing speed of the trees are analyzed in terms of the discharge magnitude distributions
  • Keywords
    discharges (electric); electric breakdown of solids; insulation testing; organic insulating materials; polymers; voids (solid); 50 Hz; PMMA; applied AC voltage; breakdown phenomenon; discharge magnitude distribution; electrical equipment; induced electric charge distribution; insulating system breakdown; insulation deterioration; insulation diagnosis; microvoid; phase analysis; polymethyl methacrylate; small voids; special internal-discharge pulse measurement system; tree growth; tree progression; Area measurement; Current measurement; Dielectrics and electrical insulation; Electric breakdown; Electric variables measurement; Electrodes; Needles; Phase measurement; Pulse measurements; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1989. Annual Report., Conference on
  • Conference_Location
    Leesburg, VA
  • Type

    conf

  • DOI
    10.1109/CEIDP.1989.69532
  • Filename
    69532