DocumentCode :
2276815
Title :
CCEM-K10 key comparison of resistance standards at 100 Ω
Author :
Schumacher, Bernd
Author_Institution :
Phys.-Tech. Bundesanstalt, Braunschweig
fYear :
2008
fDate :
8-13 June 2008
Firstpage :
142
Lastpage :
143
Abstract :
A key comparison of resistance standards at 100 Omega started in 2001. The pilot laboratory, seven national metrological institutes, and the BIPM participated in that comparison. The results of this comparison are reported.
Keywords :
electric resistance measurement; measurement standards; measurement uncertainty; resistors; measurement uncertainty; resistance 100 ohm; resistance standards; resistors; Cryogenics; Electrical resistance measurement; Hall effect; Laboratories; Linear regression; Measurement standards; Particle measurements; Polynomials; Resistors; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location :
Broomfield, CO
Print_ISBN :
978-1-4244-2399-6
Electronic_ISBN :
978-1-4244-2400-9
Type :
conf
DOI :
10.1109/CPEM.2008.4574693
Filename :
4574693
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2276815
بازگشت