Title :
SIM comparison of dc resistance at 1 Ω, 1 MΩ, and 1 GΩ
Author :
Jarrett, D.G. ; Elmquist, R.E. ; Zhang, N.F. ; Tonina, A. ; Porfiri, M. ; Femandes, J. ; Schechter, H. ; Izquierdo, D. ; Faverio, C. ; Slomovitz, D. ; Inglis, D. ; Wendler, K. ; Hernandez, F. ; Rodriguez, B.
Author_Institution :
Stat. Eng. Div., NIST, Gaithersburg, MD
Abstract :
A regional comparison of DC resistance standards at the nominal values of 1 Omega, 1 MOmega, and 1 GOmega has recently been completed in the Sistema Interamericano de Metrogia (SIM) region. The motivation, design, standards, and results of this regional comparison are reported.
Keywords :
electric resistance measurement; measurement standards; DC resistance standards; SIM; Sistema Interamericano de Metrogia; regional standards comparison; resistance 1 Gohm; resistance 1 Mohm; resistance 1 ohm; Councils; Electrical resistance measurement; Laboratories; Measurement standards; Metrology; NIST; Particle measurements; Protocols; Resistors; Standardization;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location :
Broomfield, CO
Print_ISBN :
978-1-4244-2399-6
Electronic_ISBN :
978-1-4244-2400-9
DOI :
10.1109/CPEM.2008.4574695
