DocumentCode
2277128
Title
High-k/metal gates in leading edge silicon devices
Author
James, Dick
Author_Institution
Chipworks, Ottawa, ON, Canada
fYear
2012
fDate
15-17 May 2012
Firstpage
346
Lastpage
353
Abstract
2007 saw the introduction of the first high-k/metal gate (HKMG) devices into the marketplace. This marked the return of metal-gate technology on silicon for the first time since polysilicon gates became ubiquitous in the early 1970s. Intel was the first to use high-k/metal gate in its 45-nm product. Other leading-edge manufacturers have now launched HKMG products in both gate-first and gate-last forms, and in the near future we also expect to see the first 22-nm FinFET products come onto the market. Chipworks, as a supplier of competitive intelligence to the semiconductor and electronics industries, monitors the evolution of chip processes as they come into commercial production. Chipworks has obtained parts from the leading edge manufacturers, and performed structural analyses to examine the features and manufacturing processes of the devices. The paper discusses some of the different transistor structures we have seen during the evolution of the HKMG technology, and examines the first 32/28-nm parts that were introduced.
Keywords
MOSFET; elemental semiconductors; silicon; Chipworks; FinFET; electronics industries; high-k/metal gates; leading edge devices; metal-gate technology; polysilicon gates; semiconductor industries; size 22 nm; size 45 nm; High K dielectric materials; Logic gates; MOSFETs; Metals; Stress; Advanced Materials; Advanced Processes; FEOL; Transistor Structures;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Manufacturing Conference (ASMC), 2012 23rd Annual SEMI
Conference_Location
Saratoga Springs, NY
ISSN
1078-8743
Print_ISBN
978-1-4673-0350-7
Type
conf
DOI
10.1109/ASMC.2012.6212925
Filename
6212925
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