• DocumentCode
    2277144
  • Title

    The hidden productivity: How to get more out of your equipment

  • Author

    Kalir, Adar ; Nahum, Yair ; Sharon, Andy

  • Author_Institution
    Fab/Sort Manuf., Intel Corp., Qiriat-Gat, Israel
  • fYear
    2012
  • fDate
    15-17 May 2012
  • Firstpage
    354
  • Lastpage
    358
  • Abstract
    In this paper, we present the use of a system aimed at improving the productivity of equipment, piloted at an Intel production facility for 300mm 45nm high volume manufacturing. We show that true toolset utilizations may be significantly lower than what is recorded, owing to various process and tool-related delays that occur during the tool `busy´ or `running´ state. We then demonstrate through a pilot case study how these delays were reduced by 37% and variation in delay was reduced 17-40% as well. This improvement represents an equivalent of up to 3-4% improvement in true utilization, far more than any single project or even aggregation of projects on the roadmap for availability improvement.
  • Keywords
    production equipment; production facilities; productivity; reliability; semiconductor industry; Intel production facility; availability improvement; equipment productivity; size 300 mm; size 45 nm; tool-related delays; toolset utilizations; Availability; Computer architecture; Delay; Manufacturing; Monitoring; Productivity; Real time systems; capacity; effective utilization; equipment productivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference (ASMC), 2012 23rd Annual SEMI
  • Conference_Location
    Saratoga Springs, NY
  • ISSN
    1078-8743
  • Print_ISBN
    978-1-4673-0350-7
  • Type

    conf

  • DOI
    10.1109/ASMC.2012.6212926
  • Filename
    6212926