DocumentCode :
2277215
Title :
Large-signal extraction method for GaAs and InP HEMT diodes
Author :
Schreurs, D. ; Herrebout, S. ; Nauwelaers, B. ; De Raedt, W. ; Baeyens, Y. ; Van Rossum, M. ; Coady, M.
Author_Institution :
ESAT, Katholieke Univ., Leuven, Heverlee, Belgium
fYear :
1994
fDate :
5-7 Oct 1994
Firstpage :
159
Lastpage :
164
Abstract :
A HEMT diode model intended for analog applications should be valid over the whole gate-source voltage (Tgs) range. The main difficulty of extracting the small-signal equivalent scheme of a HEMT diode, is that, contrary to the transistor extraction method, no clear distinction can be made between the calculation of the extrinsic elements (cold-FET measurements) and the intrinsic elements (hot-FET measurements). This implies that approximations used in the cold-FET extraction approach have to be reviewed. This is a particular problem for the determination of the resistances
Keywords :
III-V semiconductors; MIMIC; MMIC; electric resistance; equivalent circuits; gallium arsenide; high electron mobility transistors; indium compounds; microwave diodes; millimetre wave diodes; semiconductor device models; EHF; GaAs; HEMT diodes; InP; SHF; analog applications; cold-FET extraction; diode model; gate-source voltage range; large-signal extraction method; resistances; Application specific processors; Capacitance; Electrical resistance measurement; Equivalent circuits; Gallium arsenide; HEMTs; Indium phosphide; Scattering parameters; Schottky diodes; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Nonlinear Microwave and Millimeterwave Circuits, 1994., Third International Workshop on
Conference_Location :
Duisburg
ISSN :
0938-8028
Print_ISBN :
0-7803-2409-9
Type :
conf
DOI :
10.1109/INMMC.1994.512523
Filename :
512523
Link To Document :
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