DocumentCode
2277238
Title
Highly sensitive direct femtosecond pulse measurements using electrooptic spectral shearing interferometry
Author
Dorrer, C. ; Inuk Kang
Author_Institution
Lucent Technol. Bell Labs., Holmdel, NJ, USA
fYear
2002
fDate
24-24 May 2002
Abstract
Highly sensitive femtosecond optical pulse characterization has been performed, for the first time to our knowledge, using electrooptic spectral shearing interferometry. We report a full temporal characterization of 750-fs pulses with average power as low as 10 /spl mu/W at 156-MHz repetition rate.
Keywords
electro-optical effects; high-speed optical techniques; laser mode locking; laser variables measurement; light interferometry; sensitivity; 10 muW; 750 fs; average power; electrooptic spectral shearing interferometry; full temporal characterization; highly sensitive direct femtosecond pulse measurements; ultrafast optical pulse characterization; Fiber nonlinear optics; Optical interferometry; Optical pulse generation; Optical pulses; Optical sensors; Phase modulation; Pulse measurements; Pulse modulation; Shearing; Ultrafast optics;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2002. CLEO '02. Technical Digest. Summaries of Papers Presented at the
Conference_Location
Long Beach, CA, USA
Print_ISBN
1-55752-706-7
Type
conf
DOI
10.1109/CLEO.2002.1034471
Filename
1034471
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