• DocumentCode
    2277326
  • Title

    Temperature dependence of ferroelectric and magnetic properties in polycrystalline BiFeO3 films

  • Author

    Naganuma, Hiroshi ; Inoue, Yosuke ; Okamura, Soichiro

  • Author_Institution
    Tokyo Univ. of Sci., Tokyo
  • fYear
    2007
  • fDate
    27-31 May 2007
  • Firstpage
    431
  • Lastpage
    433
  • Abstract
    A BiFeO3 film was fabricated by a chemical solution deposition (CSD) method onto the Pt/Ti/SiO2/Si(100) substrate followed by a post-deposition annealing at 973 K for 10 min in air. An X-ray diffraction measurement indicates the formation of the polycrystalline single phase of the BiFeO3 film. The high remanent polarization of 89 muC/cm2 was observed at 90 K together with the relatively low electric coercive field of 380 kV/cm, though the ferroelectric hysteresis loops could not be observed at room temperature due to the high leakage current density. Magnetic measurements indicate that the low remanence magnetization of around 2 emu/cm3 and the magnetic coercivity field of around 0.5 kOe were obtained at room temperature. These magnetic parameters increased around twice the value by decreasing the temperature to 100 K.
  • Keywords
    X-ray diffraction; annealing; bismuth compounds; coercive force; dielectric hysteresis; dielectric polarisation; epitaxial layers; ferroelectric thin films; leakage currents; liquid phase deposition; BiFeO3; CSD method; Pt-Ti-SiO2-Si; X-ray diffraction; chemical solution deposition method; electric coercive field; ferroelectric hysteresis loops; ferroelectric properties; leakage current density; magnetic coercivity field; magnetic properties; polycrystalline films; post-deposition annealing; remanence magnetization; remanent polarization; temperature 293 K to 298 K; temperature 90 K; temperature 973 K; time 10 min; Annealing; Chemicals; Ferroelectric films; Ferroelectric materials; Magnetic field measurement; Magnetic films; Magnetic properties; Substrates; Temperature dependence; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2007. ISAF 2007. Sixteenth IEEE International Symposium on
  • Conference_Location
    Nara
  • ISSN
    1099-4734
  • Print_ISBN
    978-1-4244-1334-8
  • Electronic_ISBN
    1099-4734
  • Type

    conf

  • DOI
    10.1109/ISAF.2007.4393289
  • Filename
    4393289