DocumentCode :
2277381
Title :
Study of surface degradation of HTV silicone rubber under thermal and ultraviolet exposures
Author :
Haddad, G. ; Gupta, R.K. ; Wong, K.L.
Author_Institution :
Sch. of Electr. & Comput. Eng., RMIT Univ., Melbourne, VIC, Australia
fYear :
2012
fDate :
17-20 Sept. 2012
Firstpage :
241
Lastpage :
245
Abstract :
Polymeric insulators are widely used in electrical power system in particular transmission and distribution lines. Silicon rubber is a high performance polymeric material with superior insulation property and physical properties such as light weight. This paper presents the effects of ultra violet radiation and heat on the aging of silicon rubber and estimates the lifetime of insulators made of this material based on chemical bounds percentage at different exposure times. Experimental works were performed on samples collected from a 22KV silicone rubber insulator. The specimens were subjected to accelerated aging cycles using an Accelerated Weathering Tester (QUV) at 50°C and UVA exposure of 340nm at the irradiation intensity of 0.68W/m2 for up to 3000 hours. A series of tests were conducted on the samples using instruments that measure different aspects of aging. The degradation was examined using a Scanning Electron Microscope (SEM) and a Fourier Transforms Infrared Spectroscopy (ATR-FTIR). In addition, the color change of the specimens was measured by CHROMA Meter (CR-300). In this paper, we show that the remaining service life of the insulators can be estimated using the chemical measurements and color factors by making comparisons between new, aged and totally damaged specimens. The 3D scatterplot for the obtained data show a clear trend and timeline on how a new specimen degrades over time and eventually leads to complete failure. This information provided by the 3D scatterplot could be used to estimate the remaining life of silicone rubber insulators.
Keywords :
Fourier transform spectroscopy; ageing; infrared spectroscopy; polymer insulators; remaining life assessment; scanning electron microscopy; silicon; 3D scatterplot; ATR-FTIR; CHROMA meter; CR-300; Fourier transforms infrared spectroscopy; HTV silicone rubber; SEM; Si; UVA exposure; accelerated weathering tester; aging; distribution lines; electrical power system; instruments; insulation property; physical properties; polymeric insulators; remaining service life; scanning electron microscope; silicon rubber; surface degradation; thermal exposures; transmission lines; ultraviolet exposures; ultraviolet radiation effects; voltage 22 kV; Aging; Chemicals; Degradation; Image color analysis; Rubber; Silicon; Accelerated Ageing; FTIP; Polymeric insulators; Scanning Electron Microscope; Scatter Plot;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Voltage Engineering and Application (ICHVE), 2012 International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4673-4747-1
Type :
conf
DOI :
10.1109/ICHVE.2012.6357079
Filename :
6357079
Link To Document :
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