DocumentCode :
2277438
Title :
The energy distribution of traps in polymers based on isothermal surface potential decay measurement
Author :
Wen-Wei Shen ; Guo-Li Wang ; Yu-Gan Niu ; Jun-Liang Wang ; Li-Miao Zhang ; Yi-Qun Zhang ; Guan-Jun Zhang
Author_Institution :
State Key Lab. of Electr. Insulation & Power Equip., Xi´an Jiaotong Univ., Xi´an, China
fYear :
2012
fDate :
17-20 Sept. 2012
Firstpage :
472
Lastpage :
475
Abstract :
Charge traps have great influence on charge transport, trapping and recombination in solid dielectrics such as polymers. In this paper, the energy distribution of traps in three polymers i.e. low density polyethylene (LDPE), polypropylene (PP) and polyester (PET) has been studied, based on the isothermal surface potential decay measurement. Trap measurement and calculation formula is deduced and a trap non-contact measurement setup is specially designed. One excellence of the device is that electron or hole trap parameters can be determined by choosing negative or positive charging, respectively. On the basis of the formula acquired, the electron and hole trapping parameters of the material can be evaluated. Results reveal that potential of PET decays the fastest among these materials, probably because there is more charge injection into the bulk during corona charging. With the enhancement of temperature, both negative and positive potentials decay faster. The trap density of PET is much higher than LDPE and PP, which reveals the high polarity of the PET molecule.
Keywords :
corona; dielectric materials; electron traps; polymers; surface potential; charge injection; charge transport; charge traps; corona charging; electron trap parameter; energy distribution; hole trap parameter; isothermal surface potential decay measurement; low density polyethylene; negative charging; polyester; polymer; polypropylene; positive charging; solid dielectrics; trap density; trap measurement; trap noncontact measurement; Electric potential; Electron traps; Materials; Positron emission tomography; Surface charging; Temperature measurement; corona charging; electron trap; hole trap; polymers; surface potential decay;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Voltage Engineering and Application (ICHVE), 2012 International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4673-4747-1
Type :
conf
DOI :
10.1109/ICHVE.2012.6357082
Filename :
6357082
Link To Document :
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