DocumentCode
2277539
Title
Electrostatic actuated mems for precision AC voltage references
Author
Bounouh, A. ; Camon, H. ; Ricart, T. ; Pisella, C. ; Ziade, F. ; Polletaeff, A. ; Allal, D. ; Plana, R. ; Leprat, D.
Author_Institution
LNE, Trappes
fYear
2008
fDate
8-13 June 2008
Firstpage
220
Lastpage
221
Abstract
The purpose of this paper is to present results on the design of electrostatic actuated micro- electromechanical systems (MEMS) aiming at developing AC voltage references through mechanical-electrical transduction for electrical metrology and more generally for miniaturized instrumentation. Several test MEMS architectures (targeted AC voltages from 10 V up to 100 V) for the vertical motion have been designed and are under fabrication by an epitaxial silicon on insulator (SOI) surface micromachining process with the aim to investigate the potentialities of the different structures with respect to the geometrical dispersion, the strain sensitivity and the electrical stability.
Keywords
electrostatic actuators; micromachining; micromechanical devices; silicon-on-insulator; MEMS fabrication; electrostatic actuated MEMS design; epitaxial silicon on insulator; mechanical-electrical transduction; miniaturized instrumentation; precision AC voltage references; surface micromachining process; Electromechanical systems; Electrostatics; Fabrication; Instruments; Insulator testing; Metrology; Micromachining; Micromechanical devices; Silicon on insulator technology; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location
Broomfield, CO
Print_ISBN
978-1-4244-2399-6
Electronic_ISBN
978-1-4244-2400-9
Type
conf
DOI
10.1109/CPEM.2008.4574732
Filename
4574732
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