DocumentCode :
2277539
Title :
Electrostatic actuated mems for precision AC voltage references
Author :
Bounouh, A. ; Camon, H. ; Ricart, T. ; Pisella, C. ; Ziade, F. ; Polletaeff, A. ; Allal, D. ; Plana, R. ; Leprat, D.
Author_Institution :
LNE, Trappes
fYear :
2008
fDate :
8-13 June 2008
Firstpage :
220
Lastpage :
221
Abstract :
The purpose of this paper is to present results on the design of electrostatic actuated micro- electromechanical systems (MEMS) aiming at developing AC voltage references through mechanical-electrical transduction for electrical metrology and more generally for miniaturized instrumentation. Several test MEMS architectures (targeted AC voltages from 10 V up to 100 V) for the vertical motion have been designed and are under fabrication by an epitaxial silicon on insulator (SOI) surface micromachining process with the aim to investigate the potentialities of the different structures with respect to the geometrical dispersion, the strain sensitivity and the electrical stability.
Keywords :
electrostatic actuators; micromachining; micromechanical devices; silicon-on-insulator; MEMS fabrication; electrostatic actuated MEMS design; epitaxial silicon on insulator; mechanical-electrical transduction; miniaturized instrumentation; precision AC voltage references; surface micromachining process; Electromechanical systems; Electrostatics; Fabrication; Instruments; Insulator testing; Metrology; Micromachining; Micromechanical devices; Silicon on insulator technology; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location :
Broomfield, CO
Print_ISBN :
978-1-4244-2399-6
Electronic_ISBN :
978-1-4244-2400-9
Type :
conf
DOI :
10.1109/CPEM.2008.4574732
Filename :
4574732
Link To Document :
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