Title :
Measuring flicker with discrete fourier transform
Author :
Espel, P. ; Poletaeff, A.
Author_Institution :
LNE, Paris
Abstract :
This paper describes a new standard for precision measurements of flicker. Two different methods are used and compared. The absolute standard uncertainty (1sigma) is estimated to be a few parts in 105.
Keywords :
discrete Fourier transforms; fluctuations; measurement standards; measurement uncertainty; power supply quality; discrete Fourier transform; flicker measurement; measurement standard; precision measurements; standard uncertainty; voltage fluctuation measurement; Amplitude modulation; Digital modulation; Discrete Fourier transforms; Displacement measurement; Electromagnetic compatibility; Electromagnetic measurements; Frequency modulation; Measurement standards; Sampling methods; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location :
Broomfield, CO
Print_ISBN :
978-1-4244-2399-6
Electronic_ISBN :
978-1-4244-2400-9
DOI :
10.1109/CPEM.2008.4574733