Title :
Exchange of the 10 V Josephson array chip in the SMU voltage standard
Author :
Vrabcek, P. ; Streit, J. ; Kopcek, P.
Author_Institution :
Slovak Inst. of Metrol., Bratislava
Abstract :
Interlaboratory comparison of the SMU 10 V Josephson array voltage standard (JAVS) has been carried out with the CMI JAVS. The comparison method was indirect using Zener diode reference as the traveling standard. This paper presents besides the results of the comparison that the parameters of the SMU primary standard have been preserved after the exchange of the Josephson array chip in the system. The results show agreement between the SMU and the CMI calibrations of the Fluke 732 B reference standard 280 nV.
Keywords :
calibration; measurement standards; superconducting junction devices; CMI JAVS; Fluke 732 B reference standard; SMU voltage standard; Zener diode reference; calibrations; josephson array chip; voltage 10 V; voltage 280 nV; Calibration; Diodes; Helium; Josephson effect; Laboratories; Measurement standards; Metrology; Temperature; Uncertainty; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location :
Broomfield, CO
Print_ISBN :
978-1-4244-2399-6
Electronic_ISBN :
978-1-4244-2400-9
DOI :
10.1109/CPEM.2008.4574734
