• DocumentCode
    2277580
  • Title

    Exchange of the 10 V Josephson array chip in the SMU voltage standard

  • Author

    Vrabcek, P. ; Streit, J. ; Kopcek, P.

  • Author_Institution
    Slovak Inst. of Metrol., Bratislava
  • fYear
    2008
  • fDate
    8-13 June 2008
  • Firstpage
    224
  • Lastpage
    225
  • Abstract
    Interlaboratory comparison of the SMU 10 V Josephson array voltage standard (JAVS) has been carried out with the CMI JAVS. The comparison method was indirect using Zener diode reference as the traveling standard. This paper presents besides the results of the comparison that the parameters of the SMU primary standard have been preserved after the exchange of the Josephson array chip in the system. The results show agreement between the SMU and the CMI calibrations of the Fluke 732 B reference standard 280 nV.
  • Keywords
    calibration; measurement standards; superconducting junction devices; CMI JAVS; Fluke 732 B reference standard; SMU voltage standard; Zener diode reference; calibrations; josephson array chip; voltage 10 V; voltage 280 nV; Calibration; Diodes; Helium; Josephson effect; Laboratories; Measurement standards; Metrology; Temperature; Uncertainty; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
  • Conference_Location
    Broomfield, CO
  • Print_ISBN
    978-1-4244-2399-6
  • Electronic_ISBN
    978-1-4244-2400-9
  • Type

    conf

  • DOI
    10.1109/CPEM.2008.4574734
  • Filename
    4574734