• DocumentCode
    2277587
  • Title

    Design rules for post-CMOS through silicon vias in an industrial environment

  • Author

    Warnat, Stephan ; Marenco, Norman ; Kahler, Dirk ; Reinert, Wolfgang

  • Author_Institution
    Fraunhofer Inst. for Silicon Technol., Itzehoe
  • fYear
    2006
  • fDate
    6-8 Dec. 2006
  • Firstpage
    35
  • Lastpage
    39
  • Abstract
    Through-silicon via technology is becoming inevitable to follow the increasing interconnect density required in today´s logic products. But there are advantages to other markets as well: system-in-package solutions that integrate MEMS and ASIC chips have clearly different requirements, i.e. increased robustness against mechanical stress. Rather than targeting for ultra-thin silicon, they require standard wafer thicknesses. This article lines out some challenges in the implementation of a viable post-CMOS feedthrough technology in this domain.
  • Keywords
    CMOS integrated circuits; application specific integrated circuits; integrated circuit design; micromechanical devices; system-in-package; ASIC chips; MEMS; industrial environment; interconnect density; logic products; mechanical stress; post-CMOS feedthrough technology; system-in-package; through-silicon via technology; ultra-thin silicon; Application specific integrated circuits; CMOS process; CMOS technology; Integrated circuit interconnections; Integrated circuit technology; Microelectromechanical devices; Micromechanical devices; Silicon; Stress; Through-silicon vias;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 2006. EPTC '06. 8th
  • Conference_Location
    Singapore
  • Print_ISBN
    1-4244-0664-1
  • Electronic_ISBN
    1-4244-0665-X
  • Type

    conf

  • DOI
    10.1109/EPTC.2006.342687
  • Filename
    4147216