DocumentCode :
227772
Title :
Effect of squeezing conditions on the particle distribution and bond line thickness of particle filled polymeric thermal interface materials
Author :
Shirazy, Mahmood R. S. ; Allard, Stephanie ; Beaumier, Martin ; Frechette, L.G.
Author_Institution :
Dept. of Mech. Eng., Univ. de Sherbrooke, Sherbrooke, QC, Canada
fYear :
2014
fDate :
27-30 May 2014
Firstpage :
251
Lastpage :
259
Abstract :
An experimental study is performed to characterize the effect of squeezing conditions on the particle distribution and bond line thickness of particle filled polymeric thermal interface materials (TIM). Two different commercial particle-filled polymeric TIMs with different particle volume fractions have been used in this study. Rheological properties such as yield stress and viscosity are measured experimentally. Using laser granulometry technique, particle sizes have been measured and are further confirmed by SEM imaging. The TIM is then deposited on circular copper samples and is squeezed with different pressing rates. Analyzing the samples by acoustic microscopy technique shows that at low pressing rates the particle distribution is not uniform and a TIM branching phenomena can be observed. At higher pressing rates, the final thickness of the bond line is approximately 30% higher than low velocity pressing rates. By keeping the load on the sample at the end of the pressing procedure the final BLT will continue to decrease. It can be concluded that the optimum condition of TIM dispense procedure should include a high velocity pressing rate to attain a uniform particle distribution followed by a constant load period to obtain the minimum BLT.
Keywords :
copper; electronics packaging; filled polymers; measurement by laser beam; particle size; scanning electron microscopy; thermal resistance; thickness measurement; viscosity measurement; yield stress; SEM imaging; TIM; acoustic microscopy; bond line thickness; laser granulometry; particle filled polymeric thermal interface materials; particle size; scanning electron microscopy; squeezing conditions; uniform particle distribution; viscosity measurement; yield stress; Mathematical model; Polymers; Stress; Thermal resistance; Viscosity; Assembly process; Particle filled polymer; bond line thickness (BLT); thermal interface material (TIM);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2014 IEEE Intersociety Conference on
Conference_Location :
Orlando, FL
ISSN :
1087-9870
Type :
conf
DOI :
10.1109/ITHERM.2014.6892289
Filename :
6892289
Link To Document :
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