• DocumentCode
    2277756
  • Title

    Effect of Microwave Treatment on the Microstructure and Dielectric Properties of SnO2-doped CaCu3 Ti4O12

  • Author

    Hutagalung, Sabar D. ; Ibrahim, M. Ikhwan M ; Ahmad, Zainal A.

  • Author_Institution
    Univ. Sains Malaysia, Nibong Tebal
  • fYear
    2007
  • fDate
    27-31 May 2007
  • Firstpage
    508
  • Lastpage
    511
  • Abstract
    A microwave (MW) treatment process was performed to pre-sintered of CaCu3Ti4O12. Conventional furnace was used for calcinationd and sintered process, whereas a domestic microwave oven employed for treatment in order to produce the better phase structures, morphology and dielectric properties of CaCu3Ti4O12 products. Analysis SEM show that the microstructures of MW treated sample is better densification, fine and larger grain size if compare to the untreated sample. Dielectric properties also have been improved by MW treatment, which is higher dielectric constant and lower dielectric loss. The effect of doping concentration of SnO2 to dielectric properties of CaCu3Ti4O12 had been studied. It was found that the dielectric constant of CaCu3Ti4O12 decreased exponentially with molarities percentage of SnO2-The lowest dielectric loss value has been obtained at sample with 6 mol% doping concentration.
  • Keywords
    calcination; calcium compounds; copper compounds; densification; dielectric losses; doping profiles; grain size; microwave materials; permittivity; scanning electron microscopy; sintering; tin compounds; CaCu3Ti4O12:SnO2; SEM; calcination; densification; dielectric constant; dielectric loss; dielectric properties; doping concentration; grain size; microstructure; microwave treatment process; sintering process; Ceramics; Dielectric losses; Dielectric materials; Dielectric substrates; High-K gate dielectrics; Microstructure; Microwave ovens; Semiconductor materials; Temperature; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2007. ISAF 2007. Sixteenth IEEE International Symposium on
  • Conference_Location
    Nara
  • ISSN
    1099-4734
  • Print_ISBN
    978-1-4244-1334-8
  • Electronic_ISBN
    1099-4734
  • Type

    conf

  • DOI
    10.1109/ISAF.2007.4393314
  • Filename
    4393314