• DocumentCode
    2277796
  • Title

    Coupled-field modeling of microdevices and microsystems

  • Author

    Wachutka, Gerhard

  • Author_Institution
    Inst. for Phys. of Electrotechnol., Munich Univ. of Technol., Germany
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    9
  • Lastpage
    14
  • Abstract
    Currently strong efforts are being made to build simulation platforms for the predictive simulation of microelectromechanical devices and microsystems (MEMS) as cost-effective and time-saving alternative to the traditional experimental approach. Already today the rapid progress in microsystems technology is strongly supported by MEMS-specific modeling methodologies and dedicated simulation tools constituting a "virtual laboratory" on the computer, which enables the visualization and detailed analysis of the operating behavior of single microdevices as well as their collaborative function in a microsystem. In this context, one of the most important aspects is the consistent treatment of coupled fields and coupled energy and signal domains required for deriving macromodels of microsystems from the continuous field level. To this end, we discuss practicable methodologies for setting up physically-based consistent microdevice and full system models for the effort-economizing and yet accurate numerical simulation of micro-mechatronical components and systems.
  • Keywords
    micromechanical devices; MEMS modeling; continuous-field models; coupled-domain macromodels; coupled-domain system simulation; coupled-field device modeling; coupled-field modeling; kirchhoffian networks; microdevices; microelectromechanical devices; microsystems; numerical simulation; Analytical models; Collaborative tools; Computational modeling; Computer simulation; Laboratories; Microelectromechanical devices; Micromechanical devices; Numerical simulation; Predictive models; Visualization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation of Semiconductor Processes and Devices, 2002. SISPAD 2002. International Conference on
  • Print_ISBN
    4-89114-027-5
  • Type

    conf

  • DOI
    10.1109/SISPAD.2002.1034505
  • Filename
    1034505