Title :
Modeling field emission array tips using the MICHELLE gun code algorithm
Author :
Petillo, John J. ; Panagos, Dimitrios N. ; Jensen, Kevin L.
Author_Institution :
Leidos Corp., Billerica, MA, USA
Abstract :
Summary form only given. We report on the incorporation of a model for field emitters (FE) in the MICHELLE Particle-In-Cell (PIC) beam optics code1. The FE model is based on a Point Charge Model (PCM)2 and allows for rapid and analytical representations of tip current, variation, and emission statistics. Its usage enables determining the impact of emission variation on current characteristics and emittance. Rather than cold field emission characterized by the Fowler Nordheim (FN) equation, a General Thermal-Field (GTF) emission model treats warm and hot field emission sources.
Keywords :
field emission; field emitter arrays; particle beams; Fowler Nordheim equation; MICHELLE gun code algorithm; cold field emission; emission variation; field emission array tips; field emitters; general thermal-field emission model; hot field emission sources; particle-in-cell beam optics; point charge model; Algorithm design and analysis; Analytical models; Convergence; Iron; Mathematical model; Optical beams; Optics;
Conference_Titel :
Plasma Sciences (ICOPS) held with 2014 IEEE International Conference on High-Power Particle Beams (BEAMS), 2014 IEEE 41st International Conference on
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4799-2711-1
DOI :
10.1109/PLASMA.2014.7012535
