DocumentCode :
227782
Title :
Backscattered electrons from X-ray target
Author :
Bui, T. ; Ives, L. ; Hart, D.
Author_Institution :
Calabazas Creek Res. Inc., Mountain View, CA, USA
fYear :
2014
fDate :
25-29 May 2014
Firstpage :
1
Lastpage :
1
Abstract :
Summary form only given. Calabazas Creek Research (CCR) has been developing Beam Optics Analyzer (BOA), an adaptive meshing, finite element, charged particle trajectory modeling tool for designing 3D electron devices for the past decade. It is a multiphysics simulation tool providing several built-in analysis types including electrostatics, beam optics, electrostatic PIC, nonlinear magnetostatics, inhomogeneous Helmholtz and nonlinear heat transfer.
Keywords :
X-ray optics; electron backscattering; electrostatics; finite element analysis; magnetostatics; 3D electron device design; BOA; Beam Optics Analyzer; CCR; Calabazas Creek Research; X-ray target; adaptive meshing; backscattered electrons; beam optics; built-in analysis types; charged particle trajectory modeling tool; electrostatic PIC; electrostatics; finite element; inhomogeneous Helmholtz transfer; multiphysics simulation tool; nonlinear heat transfer; nonlinear magnetostatics; Adaptation models; Analytical models; Educational institutions; Electrostatics; Monte Carlo methods; Optical beams; Optics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Sciences (ICOPS) held with 2014 IEEE International Conference on High-Power Particle Beams (BEAMS), 2014 IEEE 41st International Conference on
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4799-2711-1
Type :
conf
DOI :
10.1109/PLASMA.2014.7012536
Filename :
7012536
Link To Document :
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