DocumentCode :
2277836
Title :
High performance V-band GaAs power amplifier and low noise amplifier using low-loss transmission line technology
Author :
Chiu, Hsien-Chin ; Ke, Bo-Yu
Author_Institution :
Dept. of Electron. Eng., Chang Gung Univ., Taoyuan, Taiwan
fYear :
2012
fDate :
10-11 May 2012
Firstpage :
1
Lastpage :
4
Abstract :
We present the design and measurement results of millimeter-wave integrated circuits implemented in 0.15-μm baseline GaAs pHEMT. Both active and passive test structures were measured. We present the design of an on-chip slow wave transmission line and RF amplifier from low loss with low noise parameter measurement results at V-band. Finally, the design and measurement result of two amplifiers for low noise amplifier (LNA) and power amplifier (PA). The three-stage LNA matching networks and RF-chock were based upon slow wave transmissions lines (TLs). Peak gain of 13.2 dB at 66 GHz, in-band minimum noise figure less then 5 dB under 3-V supply voltage were obtained at a power consumption of 89 mW. The two stage power amplifier with push-pull combination in balun structure achieves a peak gain of 16.8 dB at 58 GHz OP1dB of 11.5 dBm, Psat of 16.7 dBm, and PAE of 19.8% under 3-V supply voltage were obtained at a power consumption of 188 mW. The chip size, the LNA and PA die area including all Pads are 1.25×0.6 and 1.34 × 0.6 mm2, respectively. The LNA and PA MMICs demonstrate the superior gain and power performance in low-loss TLs technology.
Keywords :
III-V semiconductors; MMIC power amplifiers; baluns; differential amplifiers; gallium arsenide; integrated circuit testing; low noise amplifiers; millimetre wave power amplifiers; power HEMT; power consumption; transmission lines; GaAs; LNA MMIC; PA MMIC; PA die area; RF amplifier; RF-chock; active test structure; balun structure; frequency 58 GHz; frequency 66 GHz; gain 13.2 dB; gain 16.8 dB; high performance V-band power amplifier; in-band minimum noise figure; low noise amplifier; low noise parameter measurement; low-loss TL technology; low-loss transmission line technology; millimeter-wave integrated circuit; on-chip slow wave transmission line design; pHEMT; passive test structure; power 188 mW; power 89 mW; power consumption; power performance; push-pull combination; size 0.15 mum; three-stage LNA matching network; two stage power amplifier; Gain; Gallium arsenide; Noise; PHEMTs; Power amplifiers; Semiconductor device measurement; Transmission line measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Speed Intelligent Communication Forum (HSIC), 2012 4th International
Conference_Location :
Nanjing, Jiangsu
Print_ISBN :
978-1-4673-0678-2
Electronic_ISBN :
978-1-4673-0676-8
Type :
conf
DOI :
10.1109/HSIC.2012.6212968
Filename :
6212968
Link To Document :
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