• DocumentCode
    2278062
  • Title

    Automation of 1 tΩ to 100 tΩ ultra-high resistance measurements at NIST

  • Author

    Jarrett, D.G. ; Muiz-Mercado, A.M. ; Kraft, M.E.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Gaithersburg, MD
  • fYear
    2008
  • fDate
    8-13 June 2008
  • Firstpage
    270
  • Lastpage
    271
  • Abstract
    The automation of ultra-high resistance measurements at the National Institute of Standards and Technology (NIST) in the range 1 TOmega to 100 TOmega has been completed with the use of a programmable XY positioning system to facilitate the guarded connection of multiple standard resistors to an automated dual-source bridge. Automated guarded switching that is immune to leakages to ground is critical to the characterization of standard resistors and transfer standards in this range.
  • Keywords
    automation; electric resistance measurement; measurement standards; position control; automated dual-source bridge; automated guarded switching; automation; multiple standard resistors; programmable XY positioning system; resistance 1 Tohm to 100 Tohm; transfer standards; ultra-high resistance measurements; Automation; Bridge circuits; Capacitance; Coaxial components; Connectors; Electrical resistance measurement; Measurement standards; NIST; Position measurement; Resistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
  • Conference_Location
    Broomfield, CO
  • Print_ISBN
    978-1-4244-2399-6
  • Type

    conf

  • DOI
    10.1109/CPEM.2008.4574757
  • Filename
    4574757
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2278062