• DocumentCode
    2278328
  • Title

    Ductile-to-brittle transition strain rate

  • Author

    Darveaux, Robert ; Reichman, Corey

  • Author_Institution
    Amkor Technol. Inc., Chandler, AZ
  • fYear
    2006
  • fDate
    6-8 Dec. 2006
  • Firstpage
    283
  • Lastpage
    289
  • Abstract
    Solder joint failure mode depends on factors such as loading mode (shear vs. tensile), temperature, and strain rate. For any given loading mode and temperature, there is a transition from ductile failure to brittle failure as strain rate is increased. This ductile-to-brittle transition strain rate (DTBTSR) is one of the best indicators for robustness relative to impact loading. A higher value for DTBTSR is better. DTBTSR was measured for a wide range of lead free solder joints. The effects of pad metallization, solder alloy, reflow conditions, thermal aging, test temperature, and loading mode were characterized. DTBTSR was found to improve with 1) electroplated Ni/Au over other finishes (as long as the substrate supplier has a well controlled process), 2) less reflow time above liquidus for Cu pad metallization, 3) mild thermal aging, 4) higher test temperature, and 5) shear loading over tensile loading.
  • Keywords
    copper; failure analysis; gold; metallisation; nickel; reflow soldering; solders; strain ageing; tensile testing; Cu; Ni-Au; brittle failure; ductile failure; ductile-to-brittle transition; impact loading; lead free solder joints; loading mode; pad metallization; reflow conditions; solder alloy; solder joint failure mode; strain rate; test temperature; thermal aging; Aging; Capacitive sensors; Environmentally friendly manufacturing techniques; Metallization; Robustness; Soldering; Temperature; Tensile strain; Testing; Thermal loading;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 2006. EPTC '06. 8th
  • Conference_Location
    Singapore
  • Print_ISBN
    1-4244-0664-1
  • Electronic_ISBN
    1-4244-0665-X
  • Type

    conf

  • DOI
    10.1109/EPTC.2006.342730
  • Filename
    4147259