DocumentCode
2278585
Title
Cross validation of quantum simulations and optical measurements in single electron memories with silicon nano-crystallites
Author
Poncet, A. ; Busseret, C. ; Souifi, A.
Author_Institution
Lab. de Phys. de la Matiere, Inst. Nat. des Sci. Appliquees de Lyon, Villeurbanne, France
fYear
2002
fDate
2002
Firstpage
179
Lastpage
182
Abstract
Quantum simulations of single electron memories (SEM) have been performed on single nano-crystals, axisymmetrical and far enough from their neighbors to allow Poisson and Schrodinger equations to be solved in polar coordinates. The variations of the transition energies with respect to the shape of the dots is discussed, arriving to the conclusion that the major dependency is with respect to the volume of the dots, while the tunneling current depends more on their flatness. For the first time, numerical simulation results are cross checked with photoluminescence and absorption measurements in silicon quantum dots.
Keywords
Poisson equation; Schrodinger equation; elemental semiconductors; photoluminescence; semiconductor quantum dots; semiconductor storage; silicon; silicon compounds; single electron devices; ultraviolet spectra; visible spectra; Poisson equation; Schrodinger equation; Si-SiO; absorption spectra; dot flatness; dot shape; dot volume; nanocrystals; numerical simulation; photoluminescence; polar coordinates; quantum simulations; silicon nanocrystallites; silicon quantum dots; single electron memories; transition energy; tunneling current; Absorption; Electron optics; Numerical analysis; Numerical simulation; Photoluminescence; Schrodinger equation; Shape; Silicon; Single electron memory; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Simulation of Semiconductor Processes and Devices, 2002. SISPAD 2002. International Conference on
Print_ISBN
4-89114-027-5
Type
conf
DOI
10.1109/SISPAD.2002.1034546
Filename
1034546
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