DocumentCode
2278656
Title
Effect of V2 O5 on the sintering behavior, microstructure, and electrical properties of (Na0.5 K0.5 )NbO3 ceramics
Author
Pan, Hongyan ; Jin, Dengren ; Chen, Jingrong ; Meng, Zhongyan
Author_Institution
Shanghai Univ., Shanghai
fYear
2007
fDate
27-31 May 2007
Firstpage
679
Lastpage
681
Abstract
Lead-free piezoelectric ceramics V2O5-doped (Na0.5K0.5)NbO3 (abbreviated as NKN-V) has been successfully prepared by press-less sintering through the careful control of processing conditions. The sintering behavior , phase structure and electrical properties of the V2O5-doped NKN ceramics were investigated. Results show that with the introduction of 0.6 mol% V2O5, the NKN ceramics reaching the maximum value of 4.46 g/cm at the 1060degC and therefore exhibiting enhanced electric properties. But when the V2O5 content continued increasing, the density became lower possibly due to the appearing of the secondary phase as detected by XRD analysis. The dielectric properties of 0.6 and 0.9 mol% V2O5 -doped NKN ceramics perform better than pure NKN ceramics. In addition, annealing processing was proved to be an effective technique to improve dielectric properties and reduce the leakage current density (J).
Keywords
X-ray diffraction; annealing; current density; densification; dielectric properties; piezoceramics; potassium compounds; sintering; sodium compounds; vanadium compounds; (Na0.5K0.5)NbO3:V2O5; XRD analysis; annealing; densification; electrical properties; lead-free piezoelectric ceramics; leakage current density; microstructure; secondary phase; sintering; temperature 1060 C; Additives; Ceramics; Dielectrics; Environmentally friendly manufacturing techniques; Lead compounds; Leakage current; Microstructure; Plasma properties; Temperature; X-ray scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
Applications of Ferroelectrics, 2007. ISAF 2007. Sixteenth IEEE International Symposium on
Conference_Location
Nara
ISSN
1099-4734
Print_ISBN
978-1-4244-1334-8
Electronic_ISBN
1099-4734
Type
conf
DOI
10.1109/ISAF.2007.4393368
Filename
4393368
Link To Document