DocumentCode :
2278695
Title :
Reliability of indium solder die bonding of high power cm-bars
Author :
Guoguang, Lu ; Yun, Huang ; Yunfei, En
Author_Institution :
Nat. Key Lab. of Sci. & Technol. on Reliability Phys., CEPREI, Guangzhou, China
fYear :
2010
fDate :
16-19 Aug. 2010
Firstpage :
968
Lastpage :
972
Abstract :
High power semiconductor lasers have found increased applications. Indium solder is one of the most widely used solders in high power laser die bonding, its´ reliability is rated as the key parameter deciding about the more or less extensive use of indiun solder die bonding of high power diode arrays. In this paper, 20 samples were tested under two conditions, three degradation modes were observed during the lifetime test, the failure analysis results showed that the stress and defects induced during the indium solder bonding process play a key role in the degradation behavior of the bars.
Keywords :
failure analysis; indium; integrated circuit reliability; microassembling; semiconductor laser arrays; solders; In; failure analysis; high power cm-bars; high power diode arrays; high power laser die bonding; high power semiconductor lasers; indium solder die bonding; reliability; Degradation; Heating; Indium; Lifetime estimation; Reliability; Semiconductor laser arrays;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4244-8140-8
Type :
conf
DOI :
10.1109/ICEPT.2010.5582638
Filename :
5582638
Link To Document :
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