Title :
A solution for the on-line test of analog ladder filters
Author :
Vazquez, David ; Rueda, A. ; Huertas, J.L.
Author_Institution :
Dpto. de Diseno Analogico, Univ. de Sevilla, Spain
fDate :
30 Apr-3 May 1995
Abstract :
In this paper we study stability problems associated with the previously developed design for test (DFT) methodology applied to ladder filters. A solution based on simple modification of the basic DFT strategy is proposed which allows on-line testing of ladder filters. A filter example demonstrates the feasibility of the solution
Keywords :
active filters; analogue integrated circuits; circuit stability; design for testability; integrated circuit testing; ladder filters; active filters; analog ladder filters; analogue ICs; design for test methodology; on-line testing; solution feasibility; stability problems; Analog circuits; Circuit testing; Control systems; Design for testability; Digital filters; Feedback loop; Signal generators; Signal processing; Stability; System testing;
Conference_Titel :
VLSI Test Symposium, 1995. Proceedings., 13th IEEE
Conference_Location :
Princeton, NJ
Print_ISBN :
0-8186-7000-2
DOI :
10.1109/VTEST.1995.512616
