Frequency-based BIST for analog circuit testing

In this paper we propose a configuration for a VLSI analog sine wave generator with an appropriate frequency BIST. The generator is used for testing circuits that require sinusoidal input signals with a variable frequency as an input stimulus. The detectors indicate any deviation of the frequency input signal from the nominal value ±ε. A sine wave generator and two different BISTs are proposed: the defection and translation (DandT) T-BIST approach and the frequency-counter BIST approach. Some experimental results are also presented