Title :
Reflection of plane wave from multi-layered dielectrics
Author :
Thakur, K.P. ; Holmes, W.S.
Author_Institution :
Electromagn. Sensing Imaging & Sensing, Ind. Res. Ltd., Auckland, New Zealand
Abstract :
This paper presents an easy to use method to estimate the reflection coefficients of plane electromagnetic wave incident upon multiple layers of dielectrics. By using an inverse technique, the thickness of the dielectric layer can be obtained from the measurements of reflection coefficients.
Keywords :
dielectric thin films; electromagnetic wave reflection; inverse problems; multilayers; thickness measurement; dielectric layer thickness; inverse technique; multi-layered dielectrics; plane electromagnetic wave reflection coefficients; thickness determination; Dielectric measurements; Electromagnetic measurements; Electromagnetic reflection; Electromagnetic scattering; Equations; Frequency measurement; Fresnel reflection; Optical reflection; Polarization; Thickness measurement;
Conference_Titel :
Microwave Conference, 2001. APMC 2001. 2001 Asia-Pacific
Conference_Location :
Taipei, Taiwan
Print_ISBN :
0-7803-7138-0
DOI :
10.1109/APMC.2001.985520
