DocumentCode :
2278930
Title :
An optimized testable architecture for finite state machines
Author :
Kuo, Ting-Yu ; Liu, Chun-Yeh ; Saluja, Kewal K.
Author_Institution :
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
fYear :
1995
fDate :
30 Apr-3 May 1995
Firstpage :
164
Lastpage :
169
Abstract :
This paper presents a testable architecture for FSM synthesis. The transfer, synchronizing and distinguishing sequences are obtained simultaneously by adding extra edges, if necessary, and their associated inputs and outputs to the original FSM. The algorithm that achieves this minimizes the number of extra edges that make a machine testable. The testable machine has the following properties: (1) transfer sequences of length at most [log2n] where n is the number of the states in the machine, to carry the machine from state Si to state S j for all i and j, (2) a synchronizing sequence of length at most [log2n] which sets the machine to a specific state S1, and (3) a distinguishing sequence of length at most [log2n]. The states can be observed at the output. Several synthesis benchmark circuits were investigated for area by using the architecture
Keywords :
circuit optimisation; finite state machines; logic CAD; logic testing; sequences; sequential circuits; FSM synthesis; distinguishing sequences; finite state machines; optimized testable architecture; synchronizing sequence; synthesis benchmark circuits; testable machine; transfer sequences; Automata; Benchmark testing; Circuit synthesis; Circuit testing; Clocks; Encoding; Hardware; Logic testing; Sequential analysis; Synchronization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 1995. Proceedings., 13th IEEE
Conference_Location :
Princeton, NJ
ISSN :
1093-0167
Print_ISBN :
0-8186-7000-2
Type :
conf
DOI :
10.1109/VTEST.1995.512632
Filename :
512632
Link To Document :
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