Title :
VISION: an efficient parallel pattern fault simulator for synchronous sequential circuits
Author :
Nair, Rajesh ; Ha, Dong Sam
Author_Institution :
Synopsys Inc., Mountain View, CA, USA
fDate :
30 Apr-3 May 1995
Abstract :
VISION is an efficient parallel pattern fault simulator for synchronous sequential circuits. VISION is based on an earlier fault simulator called PARIS which was the first and a highly efficient parallel pattern fault simulator. In this paper, we propose four new heuristics which substantially speed up the parallel pattern fault simulation for synchronous sequential circuits. According to our experiments, our fault simulator, VISION, which incorporates the four heuristics, is about 1.6 times faster than PARIS for 16 benchmark circuits
Keywords :
VLSI; circuit analysis computing; digital simulation; fault diagnosis; flip-flops; integrated circuit testing; logic testing; sequential circuits; VISION; VLSI; benchmark circuits; heuristics; parallel pattern fault simulator; synchronous sequential circuits; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Flip-flops; Logic testing; Sequential circuits; Very large scale integration;
Conference_Titel :
VLSI Test Symposium, 1995. Proceedings., 13th IEEE
Conference_Location :
Princeton, NJ
Print_ISBN :
0-8186-7000-2
DOI :
10.1109/VTEST.1995.512641