Title :
Fault coverage analysis of RAM test algorithms
Author :
Riedel, Marc ; Rajski, Janusz
Author_Institution :
MACS Lab., McGill Univ., Montreal, Que., Canada
fDate :
30 Apr-3 May 1995
Abstract :
A methodology for evaluating the fault coverage of RAM test algorithms is proposed and the architecture of a flexible software analysis program is described. The analysis, performed for arbitrary test sequences, provides a comprehensive set of coverage statistics for functional cell-array faults. An overview of the analysis capabilities of the program is given, the fault state transition conditions for several representative fault classes are specified, and coverage analyses results for a variety of test algorithms are presented
Keywords :
fault diagnosis; integrated circuit testing; integrated memory circuits; random-access storage; RAM test algorithms; arbitrary test sequences; coverage statistics; fault coverage; fault state transition conditions; flexible software analysis program; functional cell-array faults; representative fault classes; semiconductor memories; test algorithms; Algorithm design and analysis; Automatic testing; Circuit faults; Laboratories; Performance analysis; Random access memory; Read-write memory; Semiconductor device testing; Software testing; Statistical analysis;
Conference_Titel :
VLSI Test Symposium, 1995. Proceedings., 13th IEEE
Conference_Location :
Princeton, NJ
Print_ISBN :
0-8186-7000-2
DOI :
10.1109/VTEST.1995.512642
