• DocumentCode
    2279128
  • Title

    A 65-nm-CMOS 100-MHz 87%-efficient DC-DC down converter based on dual-die system-in-package integration

  • Author

    Bergveld, Henk Jan ; Nowak, Katarzyna ; Karadi, Ravi ; Iochem, Sebastien ; Ferreira, Jorge ; Ledain, Sophie ; Pieraerts, Eric ; Pommier, Mickael

  • Author_Institution
    Res., NXP Semicond., Eindhoven, Netherlands
  • fYear
    2009
  • fDate
    20-24 Sept. 2009
  • Firstpage
    3698
  • Lastpage
    3705
  • Abstract
    The increasing number of efficient voltage conversions realized in small volumes in many applications has introduced a trend towards small-form-factor DC-DC converters with integrated passives. Preferably, the DC-DC converter is integrated with the load, often in nm-CMOS, allowing for local supply optimization yielding increased power efficiency. However, energy-storage densities in nm-CMOS are low and silicon area is expensive. Therefore, to limit cost of monolithically integrated systems, passive components have low values, leading to very high switching frequencies, which compromises efficiency. This paper follows an alternative approach, where the active converter part is realized in 65-nm CMOS and the passive part in a low-cost high-density passive-integration process. With the active die flip-chipped on the passive die a small system-in-package (SiP) is obtained with a peak efficiency of 87.5% at 100 MHz switching frequency and 85 mW output power. This performance is mainly caused by the high quality of the integrated passives.
  • Keywords
    CMOS integrated circuits; DC-DC power convertors; optimisation; system-on-package; CMOS; DC-DC down converter; dual-die system-in-package integration; frequency 100 MHz; optimization; size 65 nm; switching frequencies; voltage conversions; CMOS integrated circuits; DC-DC power conversion; Microassembly; Packaging; Passive circuits; Pulse width modulated power converters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Energy Conversion Congress and Exposition, 2009. ECCE 2009. IEEE
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-2893-9
  • Electronic_ISBN
    978-1-4244-2893-9
  • Type

    conf

  • DOI
    10.1109/ECCE.2009.5316334
  • Filename
    5316334