• DocumentCode
    227913
  • Title

    Inverse opals for fluid delivery in electronics cooling systems

  • Author

    Dusseault, Thomas J. ; Gires, Julie ; Barako, Michael T. ; Yoonjin Won ; Agonafer, Damena D. ; Asheghi, Mehdi ; Santiago, Juan G. ; Goodson, Kenneth E.

  • Author_Institution
    Stanford Univ., Stanford, CA, USA
  • fYear
    2014
  • fDate
    27-30 May 2014
  • Firstpage
    750
  • Lastpage
    755
  • Abstract
    We report the fabrication and fluid flow characterization of a class of open-cell copper foams known as copper inverse opals (CIOs). This material has finely controlled structure at the pore level, which may enable its use in microscale heat exchangers for microelectronics cooling. We fabricated CIOs by electrodepositing copper around a sacrificial template of packed polystyrene microspheres. We then removed the CIOs from their substrates and used electroetching to vary the pore structure and porosity. We characterized the geometry of the samples at various stages of fabrication with visual inspection and image analysis of scanning electron micrographs. We characterized the permeability with a through-plane flow rig and developed computational models for fluid flow in ideal face-centered cubic and hexagonally close-packed unit cells. Here we report the simulated and experimentally measured values of permeability. We also report experimental challenges that arise from the microscale dimensions of the samples.
  • Keywords
    cooling; copper; electrodeposition; etching; heat exchangers; metal foams; permeability; porosity; porous materials; CIO; copper inverse opals; electrodeposition; electroetching; fluid delivery; fluid flow characterization; microelectronics cooling; microscale heat exchangers; open-cell copper foams; polystyrene microspheres; sacrificial template; scanning electron micrographs; through-plane flow rig; Copper; FCC; Fluids; Heating; Permeability; Permeability measurement; fabrication; inverse opal; metal foam; modeling; permeability; porous media;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2014 IEEE Intersociety Conference on
  • Conference_Location
    Orlando, FL
  • ISSN
    1087-9870
  • Type

    conf

  • DOI
    10.1109/ITHERM.2014.6892356
  • Filename
    6892356