DocumentCode
227913
Title
Inverse opals for fluid delivery in electronics cooling systems
Author
Dusseault, Thomas J. ; Gires, Julie ; Barako, Michael T. ; Yoonjin Won ; Agonafer, Damena D. ; Asheghi, Mehdi ; Santiago, Juan G. ; Goodson, Kenneth E.
Author_Institution
Stanford Univ., Stanford, CA, USA
fYear
2014
fDate
27-30 May 2014
Firstpage
750
Lastpage
755
Abstract
We report the fabrication and fluid flow characterization of a class of open-cell copper foams known as copper inverse opals (CIOs). This material has finely controlled structure at the pore level, which may enable its use in microscale heat exchangers for microelectronics cooling. We fabricated CIOs by electrodepositing copper around a sacrificial template of packed polystyrene microspheres. We then removed the CIOs from their substrates and used electroetching to vary the pore structure and porosity. We characterized the geometry of the samples at various stages of fabrication with visual inspection and image analysis of scanning electron micrographs. We characterized the permeability with a through-plane flow rig and developed computational models for fluid flow in ideal face-centered cubic and hexagonally close-packed unit cells. Here we report the simulated and experimentally measured values of permeability. We also report experimental challenges that arise from the microscale dimensions of the samples.
Keywords
cooling; copper; electrodeposition; etching; heat exchangers; metal foams; permeability; porosity; porous materials; CIO; copper inverse opals; electrodeposition; electroetching; fluid delivery; fluid flow characterization; microelectronics cooling; microscale heat exchangers; open-cell copper foams; polystyrene microspheres; sacrificial template; scanning electron micrographs; through-plane flow rig; Copper; FCC; Fluids; Heating; Permeability; Permeability measurement; fabrication; inverse opal; metal foam; modeling; permeability; porous media;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2014 IEEE Intersociety Conference on
Conference_Location
Orlando, FL
ISSN
1087-9870
Type
conf
DOI
10.1109/ITHERM.2014.6892356
Filename
6892356
Link To Document