DocumentCode :
2279148
Title :
Characterization of loading effects in precision 1 Ω resistors
Author :
Jones, G.R. ; Elmquist, R.E.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD
fYear :
2008
fDate :
8-13 June 2008
Firstpage :
392
Lastpage :
393
Abstract :
Precision standard resistors manufactured within the last two decades using improved construction techniques and materials, such as the resistance alloy Evanohm, have been shown to have excellent environmental characteristics. Power dissipation (or loading) effects in several types of resistors have been examined including specifically those made of Manganin and Evanohm, and with the resistor element both sealed within a double wall container, or unsealed. Our recent tests on these resistors demonstrate that conditions of power dissipation within the resistors and the duty cycle of the power applied to the resistor have significant effect on the uncertainty of the measurement.
Keywords :
measurement uncertainty; power measurement; resistors; double wall container; measurement uncertainty; power dissipation effects; power loading; precision standard resistors; resistance alloy Evanohm; resistor element; Current measurement; Electrical resistance measurement; Manufacturing; NIST; Power dissipation; Power measurement; Resistors; Temperature; Testing; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location :
Broomfield, CO
Print_ISBN :
978-1-4244-2399-6
Electronic_ISBN :
978-1-4244-2400-9
Type :
conf
DOI :
10.1109/CPEM.2008.4574818
Filename :
4574818
Link To Document :
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