Title :
Detection and location of faults and defects using digital signal processing
Author_Institution :
Dept. of Electr. Eng., Ecole de Technol. Superieure, Montreal, Que., Canada
fDate :
30 Apr-3 May 1995
Abstract :
This paper presents the bases of a test method that can detect and locate faults and defects. This method is based on the use of digital signal processing applied on sampled current or voltage and can be applied to technologies with significant quiescent current. A simple procedure is also proposed in order to locate parasitic resistive contacts, and diagnosis potential of the method is explored
Keywords :
digital integrated circuits; fault diagnosis; fault location; integrated circuit testing; logic testing; signal processing; DSP technique; defects; diagnosis; digital signal processing; fault detection; fault location; parasitic resistive contacts; quiescent current; sampled current; sampled voltage; test method; Circuit faults; Circuit testing; Digital signal processing; Electrical fault detection; Fault detection; Fault diagnosis; Frequency estimation; Signal processing; Time to market; Voltage;
Conference_Titel :
VLSI Test Symposium, 1995. Proceedings., 13th IEEE
Conference_Location :
Princeton, NJ
Print_ISBN :
0-8186-7000-2
DOI :
10.1109/VTEST.1995.512647
