DocumentCode
2279160
Title
Detection and location of faults and defects using digital signal processing
Author
Thibeault, C.
Author_Institution
Dept. of Electr. Eng., Ecole de Technol. Superieure, Montreal, Que., Canada
fYear
1995
fDate
30 Apr-3 May 1995
Firstpage
262
Lastpage
267
Abstract
This paper presents the bases of a test method that can detect and locate faults and defects. This method is based on the use of digital signal processing applied on sampled current or voltage and can be applied to technologies with significant quiescent current. A simple procedure is also proposed in order to locate parasitic resistive contacts, and diagnosis potential of the method is explored
Keywords
digital integrated circuits; fault diagnosis; fault location; integrated circuit testing; logic testing; signal processing; DSP technique; defects; diagnosis; digital signal processing; fault detection; fault location; parasitic resistive contacts; quiescent current; sampled current; sampled voltage; test method; Circuit faults; Circuit testing; Digital signal processing; Electrical fault detection; Fault detection; Fault diagnosis; Frequency estimation; Signal processing; Time to market; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1995. Proceedings., 13th IEEE
Conference_Location
Princeton, NJ
ISSN
1093-0167
Print_ISBN
0-8186-7000-2
Type
conf
DOI
10.1109/VTEST.1995.512647
Filename
512647
Link To Document